Wooptix Launches New Phemet® In-line Semiconductor Wafer Metrology Fab Solution with Industry-leading Speed and Resolution

Wooptix Launches New Phemet® In-line Semiconductor Wafer Metrology Fab Solution with Industry-leading Speed and Resolution

MUNICH, Nov. 18, 2025 (GLOBE NEWSWIRE) -- Wooptix, an innovation leader in semiconductor wavefront phase imaging metrology, today introduced its new Phemet® metrology system that provides ultra-fast and extremely accurate wafer shape and geometry measurements with sub-nanometer resolution. The company will showcase Phemet® at SEMICON Europa, Booth #B1679, taking place November 18-21 in Munich. "Phemet® addresses the growing demand for improved p…

Wooptix Launches New Phemet In-line Semiconductor Wafer Metrology Fab Solution with Industry-leading Speed and Resolution

Phemet captures more than 16 million data points in one second with ultra-high resolution for highly accurate surface measurements of memory and logic devices and advanced packages.

Phemet In-line Semiconductor Wafer Metrology Captures 16 Million Data Points Per Second

Wooptix, an innovator in semiconductor wavefront phase imaging metrology, has announced the introduction of its new Phemet metrology system that provides ultra-fast and extremely accurate wafer shape and geometry measurements with sub-nanometer resolution. The post Phemet In-line Semiconductor Wafer Metrology Captures 16 Million Data Points Per Second appeared first on Metrology and Quality News - Online Magazine.