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The Severity Of Test Escapes And SDCs Caused By Them (Google)
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The Severity Of Test Escapes And SDCs Caused By Them (Google)
A new technical paper titled “Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing” was published by Google. Abstract “Too many defective compute chips are escaping existing manufacturing tests — at least an order of magnitude more than industrial targets across all compute chip types in data centers. Silent data corruptions (SDCs) caused by test escapes, when left unaddressed, pose a major threat to reliable computing. We pre…
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