Published • loading... • Updated
HW Security: Inner Product Masking With Fault Detection Via ISE (KU Leuven, NUS, Rambus)
Summary by Semiconductor Engineering
1 Articles
1 Articles
HW Security: Inner Product Masking With Fault Detection Via ISE (KU Leuven, NUS, Rambus)
A new technical paper titled “Extending and Accelerating Inner Product Masking with Fault Detection via Instruction Set Extension” was published by researchers at KU Leuven, National University of Singapore, and Rambus. Abstract “Inner product masking is a well-studied masking countermeasure against side-channel attacks. IPM-FD further extends the IPM scheme with fault detection capabilities. However, implementing IPM-FD in software especially …
Coverage Details
Total News Sources1
Leaning Left0Leaning Right0Center0Last UpdatedBias DistributionNo sources with tracked biases.
Bias Distribution
- There is no tracked Bias information for the sources covering this story.
Factuality
To view factuality data please Upgrade to Premium
