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Church · United StatesTraditional Charged Device Model testing falls short for bare dies in 2.5D/3D devices. With discharge currents reaching 500 mA at just 5V, existing methods can't handle the unique challenges of testing unpackaged components. CCTLP emerges as a promising alternative for reliable low-voltage testing. The post Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method appeared first on In Compliance Magazine.See the Story
Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method - In Compliance Magazine
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