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Sony Unveils Fastest Low-Noise X-Ray CMOS Sensor for Precision Measurement

The sensor combines 26,100 fps imaging with 34 e-rms noise to improve X-ray inspection and measurement across battery, semiconductor and research uses.

  • On Monday, Sony Semiconductor Solutions Corporation announced the IMX711, a direct conversion charge-integrating X-ray CMOS image sensor scheduled for mass production in the first quarter of FY2026.
  • Conventional X-ray sensors struggle with measurement accuracy due to photon counting errors in high-flux conditions and noise under low-flux conditions. Sony designed the IMX711 to resolve this by outputting both integrated X-ray energy and photon energy data on one chip.
  • The IMX711 achieves the industry's fastest maximum 26,100 fps frame rate and reduces random noise to 34 e-rms, enabling precise detection of faint X-ray signals previously obscured by noise.
  • Sony developed this technology in collaboration with RIKEN, utilizing a pixel structure invented by Dr. Takaki Hatsui to improve sensitivity and high-voltage tolerance for practical industrial deployment.
  • Applications for the IMX711 include high-speed inspection of batteries and semiconductors, and the sensor contributes to new scientific measurement methods across materials research and life sciences.
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The Conway Daily SunThe Conway Daily Sun
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Sony Semiconductor Solutions to Release X-ray CMOS Sensor with Industry's Fastest(*1) Imaging and Low-Noise Performance for Inspection and Measurement Instrumentation

High-accuracy energy measurements and photon-level data acquisition on a single chip

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PR Newswire broke the news in United States on Tuesday, June 9, 2026.
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