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Scientists Achieve Record Conductivity in Silicon Chip Material

Researchers developed a nanometre-thin germanium-on-silicon material with hole mobility of about 7.15 million cm²/Vs, surpassing industrial silicon conductivity.

  • On November 24, Materials Today published that University of Warwick Semiconductors Research Group and National Research Council of Canada measured record hole mobility of 7.15 million cm2/Vs in nanometre-thin compressively strained germanium-on-silicon material.
  • Faced with silicon's limits, researchers revived germanium for its superior properties and compatibility with mainstream silicon manufacturing to enable faster, lower-power electronics.
  • Using a nanometre-thin germanium layer on silicon, the team grew a nanometre-thin compressively strained germanium epilayer and applied precise compressive strain to produce an ultra-clean crystal, Dr Maksym Myronov said.
  • Dr Sergei Studenikin, Principal Research Officer, said `This sets a new benchmark for charge transport in group-IV semiconductors`, marking a major milestone for Warwick and reinforcing UK leadership.
  • Researchers highlight potential uses in quantum information processing, spin qubits, cryogenic controllers, AI and data-centre hardware, as the material could enable faster, energy-efficient future chips and quantum devices.
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Physics World broke the news in on Tuesday, November 18, 2025.
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