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Hong Kong university engineers breakthrough in microelectronics
The device achieved sub-60 mV/decade switching at room temperature and cut the gate-voltage range to 160 mV, researchers said.
The Hong Kong Polytechnic University research team engineered a novel tunnelling field-effect transistor using 2D nanomaterials, led by Professor Jianhua Hao, head of the Department of Physics and Materials.
Conventional transistors rely on thermionic emission requiring a minimum gating voltage of 60 mV, but the physical "Boltzmann limit" makes subthreshold swing values below 60 mV decade impossible at room temperature, restricting energy efficiency.
Operating at room temperature on silicon substrates, the device utilizes an ultra-thin heterostructure of 2D bismuth and indium selenide, requiring a gate-voltage range of only 160 mV versus the 800 mV originally required.
The device resolves experimental TFET challenges by delivering high output current and an exceptionally high ON/OFF current ratio, achieving subthreshold swing values well below the 60 mV limit.
Published in the journal Science, the breakthrough enables ultra-low-power, high-performance integrated circuits. "By adopting quantum tunnelling, our TFET breaks through this boundary," Prof. Hao said, highlighting importance for emerging AI chips.