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Fast CT Scanning with Tight Metrology Specifications – Metrology and Quality News - Online Magazine
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Fast CT Scanning with Tight Metrology Specifications – Metrology and Quality News - Online Magazine
ZEISS has introduced the new ZEISS METROTOM 800 320 kV, a cutting-edge CT system that elevates the speed and precision of measuring complex components made from high-density materials. This system allows companies to significantly enhance efficiency and reduce costs through rapid measurements and exceptional accuracy. The post Fast CT Scanning with Tight Metrology Specifications appeared first on Metrology and Quality News - Online Magazine.
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