Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that interfere with electrical flow. A joint research team has developed a new analysis method that can detect these "hidden defects" (electronic traps) with approximately 1,000 times higher sensitivity than existing techniques.